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Cover von Special issue on test synthesis
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Year: 1997
Publisher: Boston, Kluwer
Series: Journal of electronic testing : 11. 1997, 1
Media group: SPECIAL ISSUE
Cover von Special issue on multi-chip module testing and design for testability
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Year: 1997
Publisher: Boston, Kluwer
Series: Journal of electronic testing : 10. 1997, 1/2
Media group: SPECIAL ISSUE
Cover von Special issue on analog and mixed signal testing
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Year: 1996
Publisher: Boston, Kluwer
Series: Journal of electronic testing : 9. 1996, 1/2
Media group: SPECIAL ISSUE
Cover von Special issue on partial scan methods
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Year: 1995
Publisher: Boston, Kluwer
Series: Journal of electronic testing : 7. 1995, 1/2
Media group: SPECIAL ISSUE
Cover von Special issue on memory testing
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Year: 1994
Publisher: Boston, Kluwer
Series: Journal of electronic testing : 5. 1994, 4
Media group: SPECIAL ISSUE
Cover von Special issue on Iddq testing of VLSI circuits
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Year: 1992
Publisher: Boston, Kluwer
Series: Journal of electronic testing : 3. 1992, 4
Media group: SPECIAL ISSUE
Cover von Joint special issue on analog and mixed-signal testing
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Year: 1993
Publisher: Dordrecht, Kluwer
Series: Journal of electronic testing : 4. 1993, 4
Media group: SPECIAL ISSUE
Cover von Special issue on synthesis, test and verification
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Year: 1993
Publisher: Boston, Kluwer
Series: Journal of electronic testing : 4. 1993, 1
Media group: SPECIAL ISSUE
Cover von Special Section on Approximate Systems
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Year: 2022
Publisher: New York, ACM
Series: ACM transactions on design automation of electronic systems; 27. 2022, 2
Media group: SPECIAL ISSUE
Cover von A note on Graph Automorphism and Smart Reductions
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Year: 2018
Publisher: Rehovot, Electronic Colloquium on Computational Complexity
Series: Electronic Colloquium on Computational Complexity; Revision #1 to TR15-162
Media group: ARTICLE
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